Cart (Loading....) | Create Account
Close category search window
 

Design, Modeling, and Control of a Micromachined Nanopositioner With Integrated Electrothermal Actuation and Sensing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Yong Zhu ; Sch. of Eng., Griffith Univ., Nathan, NSW, Australia ; Bazaei, A. ; Moheimani, S.O.R. ; Yuce, M.R.

In this paper, a real-time feedback control of a novel micromachined one-degree-of-freedom thermal nanopositioner with on-chip electrothermal position sensors is presented. The actuation works based on thermal expansion of silicon beams. The sensing mechanism works based on measuring the difference between the electrical resistances of two electrically biased identical silicon beams. The difference increases with displacement, as the heat conductance of the sensor beams varies oppositely with position, resulting in different beam temperatures and resistances. The sensor pair is operated in differential mode to reduce low-frequency drift. The nanopositioner has a nonlinear static input-output characteristic. An open-loop controller is first designed and implemented. It is experimentally shown that uncertainties and sensor drift result in an unacceptable nanopositioner performance. Hence, feedback control methods are necessary for accurate nanopositioning. A closed-loop feedback control system is designed using a proportional-integral controller together with the nonlinear compensator used for the open-loop control system. The closed-loop system provides an acceptable and robust tracking performance for a wide range of set point values. For triangular reference tracking, which is needed in raster-scanned scanning probe microscopy, the tracking performance of the closed-loop system is further improved by incorporating a feedforward controller.

Published in:

Microelectromechanical Systems, Journal of  (Volume:20 ,  Issue: 3 )

Date of Publication:

June 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.