Cart (Loading....) | Create Account
Close category search window
 

Automated software test data generation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Korel, B. ; Dept. of Comput. Sci., Wayne State Univ., Detroit, MI, USA

An alternative approach to test-data generation based on actual execution of the program under test, function-minimization methods and dynamic data-flow analysis is presented. Test data are developed for the program using actual values of input variables. When the program is executed, the program execution flow is monitored. If during program execution an undesirable execution flow is observed then function-minimization search algorithms are used to automatically locate the values of input variables for which the selected path is traversed. In addition, dynamic data-flow analysis is used to determine those input variables responsible for the undesirable program behavior, significantly increasing the speed of the search process. The approach to generating test data is then extended to programs with dynamic data structures and a search method based on dynamic data-flow analysis and backtracking is presented. In the approach described, values of array indexes and pointers are known at each step of program execution; this information is used to overcome difficulties of array and pointer handling

Published in:

Software Engineering, IEEE Transactions on  (Volume:16 ,  Issue: 8 )

Date of Publication:

Aug 1990

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.