Cart (Loading....) | Create Account
Close category search window
 

Joint estimation of target reflectivity and local oscillator phases in a MIMO radar system with distributed assets

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Changyu Sun ; Dept. of Electr. & Comput. Eng., Michigan Technol. Univ., Houghton, MI, USA ; Fuhrmann, D.R.

Synchronization across multiple distributed apertures is the standard assumption in proposed multiple-input multiple-output (MIMO) radar systems. However, perfect phase synchronization is difficult to realize. Assuming frequency synchronization, probably through a GPS system or reception of a beacon, we address the issue of unknown LO phases of local oscillators in a MIMO radar system, and consider the problem of joint estimation of target reflectivity and LO phases. The bistatic target reflectivity is subject to a complex normal prior distribution given by a multiple point scatterer model and LO phases are assumed independent and identically distributed random variables.

Published in:

Signals, Systems and Computers (ASILOMAR), 2010 Conference Record of the Forty Fourth Asilomar Conference on

Date of Conference:

7-10 Nov. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.