By Topic

Effect of strain on the local perovskite structure: La0.5Sr0.5CoO3

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Woicik, J.C. ; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA ; Xie, C.K. ; Wells, B.O.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Extended x-ray-absorption fine structure has been used to study the bond-length and bond-angle distortions in thin (∼220 Å) La0.5Sr0.5CoO3 films grown epitaxially on SrTiO3 and LaAlO3 substrates. Growth on these substrates produces films with both in-plane tensile and in-plane compressive strains, respectively. It is found that the strain imposed on the thin-film lattice is accommodated mostly through changes in the first-shell Co–O bond lengths and third-shell Co–Co distances, while second-shell Co–La and Co–Sr distances behave similarly to distortions found previously in the tetrahedral semiconductors; i.e., they are most strongly affected by bond-angle distortions that account for the relaxation of the film lattice constant perpendicular to the film/substrate interface. These structural changes are directly correlated with the magnetic properties of the films.

Published in:

Journal of Applied Physics  (Volume:109 ,  Issue: 8 )