By Topic

Micromachined microwave transmission lines in CMOS technology

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
V. Milanovic ; Dept. of Electr. Eng. & Comput. Sci., George Washington Univ., Washington, DC, USA ; M. Gaitan ; E. D. Bowen ; M. E. Zaghloul

Coplanar waveguides were designed and fabricated through a commercial CMOS process with post-processing micromachining. The transmission-line layouts were designed with commercial computer-aided design (CAD) tools. Integrated circuits (ICs) were fabricated through the MOSIS service, and subsequently suspended by top-side etching. The absence of the lossy silicon substrate after etching results in significantly improved insertion-loss characteristics, dispersion characteristics, and phase velocity. Two types of layout are presented for different ranges of characteristic impedance. Measurements of the waveguides both before and after micromachining were performed at frequencies from 1 to 40 GHz using a vector network analyzer and de-embedding techniques, showing improvement of loss characteristics of orders of magnitude. For the entire range of frequencies, for the 50-Ω layout, losses do not exceed 4 dB/cm. These losses are mainly due to the small width and thickness of the metal strips. Before etching, losses are as high as 38 dB/cm due to currents in the underlying substrate. Phase velocity in the micromachined transmission lines is close to that in free space

Published in:

IEEE Transactions on Microwave Theory and Techniques  (Volume:45 ,  Issue: 5 )