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Optimum noise measure configurations for transistor negative resistance amplifiers

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2 Author(s)
Gardner, P. ; Sch. of Electron. & Electr. Eng., Birmingham Univ., UK ; Paul, D.K.

A new method, using the noise matrix approach, has been developed for determining the optimum reactive terminations for a transistor employed as a low-noise negative-resistance element in a reflection-mode amplifier. This new method corroborates the less efficient graphical method the authors reported earlier. It is established theoretically and demonstrated numerically that the optimum noise measure of a transistor used in a reflection-mode amplifier is independent of the choice of active terminal and is identical to the optimum noise measure of the same transistor when used in a conventional transmission-mode amplifier

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:45 ,  Issue: 5 )

Date of Publication:

May 1997

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