Cart (Loading....) | Create Account
Close category search window
 

Verification of Noise-Parameter Measurements and Uncertainties

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Randa, J. ; Nat. Inst. of Stand. & Technol., Boulder, CO, USA ; Dunsmore, Joel ; Dazhen Gu ; Wong, K.
more authors

We propose and implement verification methods for measurements of the noise parameters of amplifiers and transistors. Because the verification rests on the comparison of different measurement results, it also serves as a test of the uncertainties. The verification process consists of first measuring separately both a passive two-port device and the amplifier or transistor of interest [the device under test (DUT)] and then measuring the tandem configuration of the passive device plus the DUT. The results of the measurements on the tandem configuration are compared to the results predicted based on the noise parameters and scattering parameters of the two individual components. In this paper, we describe the method, discuss the uncertainty analysis, and present measurement results demonstrating the application of the method using a mismatched transmission line as the passive device. We also present simulation results demonstrating the ability of the method to detect measurement errors.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:60 ,  Issue: 11 )

Date of Publication:

Nov. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.