Cart (Loading....) | Create Account
Close category search window
 

Robust Optimization Using a Methodology Based on Cross Entropy Methods

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Ho, S.L. ; Dept. of Electr. Eng., Hong Kong Polytech. Univ., Hong Kong, China ; Shiyou Yang ; Yingying Yao ; Fu, W.N.

To address the performance degradations of optimal designs arising from uncertainties using traditional concepts and methodologies, a robust oriented cross entropy method is proposed. To efficiently compute the solutions with robust performances, the normal distribution function is used as the probability density function, and a methodology for evaluating and assigning robust performance to promising solutions is proposed. A statistical model is introduced for the constraint functions to enhance the quality of the final design. To find the global and robust optimal solutions simultaneously in a single run, the original objective rather than the robust performance parameters is used for selecting the elite solutions. Two examples are reported to validate the proposed algorithm.

Published in:

Magnetics, IEEE Transactions on  (Volume:47 ,  Issue: 5 )

Date of Publication:

May 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.