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Note: Ferrule-top atomic force microscope. II. Imaging in tapping mode and at low temperature

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3 Author(s)
Chavan, D. ; Faculty of Sciences, Department of Physics and Astronomy and LaserLaB, Vrije Universiteit, Amsterdam, The Netherlands ; Andres, D. ; Iannuzzi, D.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3579496 

In a recent paper [D.Chavan etal, Rev. Sci. Instrum. 81, 123702 (2010)] we have demonstrated that ferrule-top cantilevers, obtained by carving the end of a ferruled fiber, can be used for contact mode atomic force microscopy in ambient conditions. Here we show that those probes can provide tapping mode images at both room and cryogenic temperatures (12 K).

Published in:

Review of Scientific Instruments  (Volume:82 ,  Issue: 4 )

Date of Publication:

Apr 2011

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