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Impact of logic synthesis on soft error vulnerability using a 90-nm bulk CMOS digital cell library

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8 Author(s)
Limbrick, D.B. ; Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA ; Black, D.A. ; Dick, K. ; Atkinson, N.M.
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Reliability-aware logic synthesis can be used to mitigate a circuit's response to radiation-induced soft errors. This paper analyzes the impact of using reliability-aware logic synthesis to reduce both the pulse width and the drain area of a circuit. Using our targeted cell library, several benchmark circuits were analyzed to identify equivalent, less-vulnerable implementations while minimizing penalties. Results showed that replacing cells with alternative implementations can lower a circuit's typical pulse width by greater than 30% and typical drain area by greater than 40%. The respective area penalties incurred are less than 115% and 65%.

Published in:

Southeastcon, 2011 Proceedings of IEEE

Date of Conference:

17-20 March 2011