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TID in Flash-Based FPGA: Power Supply-Current Rise and Logic Function Mapping Effects in Propagation-Delay Degradation

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6 Author(s)
Kastensmidt, F.L. ; Inst. de Inf., Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil ; Fonseca, E.C.P. ; Vaz, R.G. ; Goncalez, O.L.
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We exposed a flash-based FPGA to radiation to measure variations in current, temperature, propagation-delay and duty-cycle in logic circuits. Propagation-delay degradations vary from 400% to 1100% before functional failure, according to circuit and logical mapping. Electrical simulations are carried out to study the difference of behavior in the degradation of different logic mappings.

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Nuclear Science, IEEE Transactions on  (Volume:58 ,  Issue: 4 )