By Topic

Measurement and Characterization of High Frequency Losses in Nonideal Litz Wires

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Hans Rossmanith ; Chair of Electromagnetic Fields , Erlangen University, Erlangen, Germany ; Marc Doebroenti ; Manfred Albach ; Dietmar Exner

Commercially available litz wires are fabricated in several ways, depending on the number of strands and on the cost frame, either as twisted strands, as twisted bundles of twisted strands or as braided strands. The bundles have a finite pitch length, and the permutation of strands within this length is not perfect. This paper illustrates the effects of this nonideal construction on skin and proximity losses in the winding and indicates some applications where this may become important. Test setups have been developed to measure skin losses and proximity losses separately, thus offering the possibility of quantifying the quality of real litz wires by comparing the test results with the ideal behavior.

Published in:

IEEE Transactions on Power Electronics  (Volume:26 ,  Issue: 11 )