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Dose Rate and Static/Dynamic Bias Effects on CCDs Degradation

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6 Author(s)
Martin, E. ; CNES, Onera, Toulouse, France ; Nuns, T. ; David, J.-P. ; Gilard, O.
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Dark current evolution in Charge Coupled Devices (CCD) is experimentally studied with Co-60 and proton irradiations. Linear CCDs are irradiated in various static and dynamic bias conditions. Annealing effects are discussed and on-ground data are compared to in-flight data. Presented results on ionization-induced dark current increase in CCDs have demonstrated the impact of the sensor operational conditions and dose rate, revealing an ELDRS-like effect.

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Nuclear Science, IEEE Transactions on  (Volume:58 ,  Issue: 3 )