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Design and Characterization of Current-Assisted Photonic Demodulators in 0.18- \mu\hbox {m} CMOS Technology

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8 Author(s)
Dalla Betta, G.-F. ; Dept. of Inf. Eng. & Comput. Sci., Univ. of Trent, Trent, Italy ; Donati, S. ; Hossain, Q.D. ; Martini, G.
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We report on the design of a current-assisted photonic demodulator (CAPD) using standard 0.18-μm complementary metal-oxide-semiconductor technology and its electrooptical characterization. The device can perform both light detection and demodulation in the charge domain, owing to a drift field generated in the silicon substrate by a majority carrier flow. Minimum-sized 10 × 10 μm2 CAPDs exhibit a direct-current charge-transfer efficiency larger than 80% (corresponding to demodulation contrast larger than 40% under sine-wave modulation) at the modest power consumption of 10 μW and a 3-dB bandwidth of >; 45 MHz. An excellent linearity value with an error lower than 0.11% is obtained in phase measurements. CAPDs with optimized modulation electrode geometries are finally designed, aiming at an improved contrast-versus-power tradeoff.

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Electron Devices, IEEE Transactions on  (Volume:58 ,  Issue: 6 )