By Topic

Effects of CrRu–SiOx underlayer with MgO intermediate layer on the microstructure and magnetic properties of FePt–C thin film

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Li, H.H. ; Department of Materials Science and Engineering, National University of Singapore, Singapore 117576, Singapore ; Hu, J.F. ; Ju, G. ; Chow, G.M.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3564946 

The effect of the CrRu–SiOx underlayer with different doping concentrations and the thickness of the CrRu underlayer on the microstructure and magnetic properties of FePt–C films were investigated. FePt films exhibited L10 (001) texture at various SiOx doping concentrations. The coercivities were as large as 28 kOe and the slope of M–H loop at coercivity was approximately equal to 1, suggesting that FePt grains were well exchange decoupled. Grain size was only slightly reduced after introducing the CrRu–SiOx underlayer. But the contact angle between the FePt grains and the MgO intermediate layer around 135° indicated the a MgO intermediate layer was not favored for smaller grains to obtain good L10 (001) texture. X-ray photoelectron spectroscopy in-depth profile showed that Si diffused into a whole FePt–C layer and C diffused to the film surface.

Published in:

Journal of Applied Physics  (Volume:109 ,  Issue: 7 )