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A sub-electron readout noise CMOS image sensor with pixel-level open-loop voltage amplification

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3 Author(s)
Lotto, C. ; Heliotis, Root Längenbold, Switzerland ; Seitz, P. ; Baechler, T.

An ultra-low-noise CMOS image sensor based on an alternative pixel circuit featuring pixel-level voltage amplification is reported. Besides a significant reduction in the contribution of electronic noise generated in column-level circuits, pixel-level voltage amplification achieves sub-electron noise of the pixel-level circuit even without any column-level low-pass filter.

Published in:
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International

Date of Conference: 20-24 Feb. 2011

Page(s):
402 - 404
ISSN :
0193-6530
Print ISBN:
978-1-61284-303-2
INSPEC Accession Number:
11930860
Conference Location :
San Francisco, CA
Digital Object Identifier :
10.1109/ISSCC.2011.5746370
Product Type:
Conference Publications

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