By Topic

A digitally controlled DC-DC buck converter with lossless load-current sensing and BIST functionality

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Tao Liu ; Arizona State Univ., Tempe, AZ, USA ; Hyunsoo Yeom ; Vermeire, B. ; Adell, P.
more authors

Lossless load current sensing ability is one of the most desirable features of contemporary current-or voltage-mode-controlled DC-DC converters. Current sensing can be used for short circuit detection, multi-stage converter load balancing, thermal control, and load-independent control of DC-DC converters (Woo et al., 2008). Recently, current sensing techniques using the existing inductor series DC resistance (DCR) are gaining attention due to their reduced complexity and minimized loss. These techniques increase the need for inductor build-in self test (BIST) ability to measure DCR. Inductor BIST is also critical for high-reliability applications such as automotive and aerospace systems where component variation and drift need to be closely monitored. An analog inductor characterization and current sensing technique utilizing Gm-C filtering is proposed in [2], where the gain errors and sensing offset are cancelled in analog domain. The DC-DC buck converter presented here uses an offset-independent inductor characterization enabling a digital continuous lossless load-current-sensing scheme. The proposed inductor BIST and current-sensing techniques can be extended to current-mode-controlled converters and multi-stage parallel converters as well.

Published in:

Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International

Date of Conference:

20-24 Feb. 2011