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An Automatic Surface Elasticity Measurement and Error Compensation Method Based on Contact Mode AFM

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3 Author(s)
Yangjie Wei ; Graduate School and the State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China ; Zaili Dong ; Chengdong Wu

Force aroused from the contact of atomic force microscope (AFM) tip to a sample surface can induce compression of the sample due to its elasticity, thus causing the scanned height image of AFM to be lower than expected. A theoretical investigation of surface elasticity measurement and error compensation method is proposed in this paper. The error source of the height image is systematically demonstrated by analyzing the force curve of different materials in contact mode. Furthermore, an automatic surface elasticity measurement and error compensation method based on information fusion and parameter identification are proposed. In addition, Kalman filter is utilized to filter the compensated height image in order to eliminate system noise. Experimental results show the validity of the proposed compensation method and Kalman filter.

Published in:

IEEE Transactions on Nanotechnology  (Volume:10 ,  Issue: 6 )