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Experiments with ABIST test methodology applied to path delay fault testing

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3 Author(s)
Manikandan, P. ; Electron. & Telecommun. Eng., Norwegian Univ. of Sci. & Technol., Trondheim, Norway ; Larsen, B.B. ; Aas, E.J.

This paper presents SIC based test stimuli with Arithmetic Built in Self-Test (ABIST) concept in order to detect the path delay faults. The presented generator with ABIST stimuli is quite useful for detecting the K-longest path-delay faults of the microprocessor. This paper extends the work of Ø. Gjermundnes and presents its application and validation to the Intel 8051 microprocessor. The experimental results of this work with the given test case microprocessor allows us to validate the proposed test method is effective by the obtained fault coverage.

Published in:

Design & Test Symposium (EWDTS), 2010 East-West

Date of Conference:

17-20 Sept. 2010