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Evolutionary approach to test generation of sequential digital circuits with multiple observation time strategy

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2 Author(s)
Yu. A. Skobtsov ; Donetsk National Technical University, Ukraine ; V. Yu. Skobtsov

In the paper there was considered an application of genetic algorithm to test generation for sequential circuits with using multiple observation time strategy of output signals. Suggested method allows detect the faults, which are undetectable by traditional methods, and increase fault coverage. Further directions of research consist in application of this approach in test generation for sequential circuits in combination with genetic algorithms and symbolic simulation.

Published in:

Design & Test Symposium (EWDTS), 2010 East-West

Date of Conference:

17-20 Sept. 2010