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Current single event effect test results for candidate spacecraft electronics

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12 Author(s)
K. A. LaBel ; NASA Goddard Space Flight Center, Greenbelt, MD, USA ; A. K. Moran ; D. K. Hawkins ; A. B. Sanders
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We present both proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital and analog devices were tested, including EEPROMs, DRAMs, and DC-DC converters

Published in:

Radiation Effects Data Workshop, 1996., IEEE

Date of Conference:

19 Jul 1996