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500 GHz–750 GHz Rectangular-Waveguide Vector-Network-Analyzer Calibrations

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1 Author(s)
Williams, D.F. ; Nat. Inst. of Stand. & Technol., Boulder, CO, USA

We develop an uncertainty analysis that captures the dominant sources of measurement error in state-of-the-art WM-380 (WR 1.5) rectangular-waveguide vector-network-analyzer measurements over the frequency range 500-750 GHz. We use the analysis to assess thru-reflect-line, thru-short-match, and thru-short-radiating-open calibrations. The comparison shows that thru-short-match and thru-short-radiating-open calibrations outperform thru-reflect-line calibrations, and that this is true even when multiple lines and optimal averaging are used to improve the thru-reflect-line calibrations.

Published in:

Terahertz Science and Technology, IEEE Transactions on  (Volume:1 ,  Issue: 2 )

Date of Publication:

Nov. 2011

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