By Topic

Modeling, design, and analysis of interferometric cantilevers for time-resolved force measurements in tapping-mode atomic force microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Sarioglu, A.F. ; E. L. Ginzton Laboratory, Stanford University, Stanford, California 94305, USA ; Solgaard, O.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3553852 

Cantilevers with interferometric high bandwidth force sensors can resolve nonlinear tip-sample interaction forces in tapping-mode atomic force microscopy. In this paper, we provide a detailed analysis of time-resolved force measurements using such cantilever. We first model the probe as a coupled spring-mass system and investigate its steady state dynamics under tapping-mode imaging conditions. Next, we analyze the optical response of the interferometric force sensor: Diffraction patterns as a function of tip displacement are obtained both analytically and by simulations. Finally, the frequency response of the force sensor is calculated, and the effects of the sensor geometry variations on the sensor mechanical response are analyzed.

Published in:

Journal of Applied Physics  (Volume:109 ,  Issue: 6 )