By Topic

Parameterization of the scatter response function in SPECT imaging using Monte Carlo simulation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Frey, E.C. ; Dept. of Radiol. & Curriculum in Biomed. Eng., North Carolina Univ., Chapel Hill, NC, USA ; Tsui, B.M.W.

The authors have generated SRFs (scatter response functions) using the Monte Carlo simulation method and investigated the characteristics of the scattered radiation by fitting the SRFs with fitting functions. The parameters of the fitting functions were studied as a function of source position in a water-filled cylindrical phantom with circular cross section. The parametrization of the SRF provides insight into the spatial distribution of detected scattered radiation in SPECT (single-photon-emission computed tomography) and is useful in developing a method to compensate for its effects in order to improve both the quality and quantitative accuracy of SPECT images

Published in:

Nuclear Science, IEEE Transactions on  (Volume:37 ,  Issue: 3 )