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Testing logic-intensive memory ICs on memory testers

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4 Author(s)
Wu, R. ; Fast Static RAM Div., Motorola, MD, USA ; Gerner, J. ; Weelus, R. ; Lew, K.

Presents Lotom, a tool which converts logic test vectors into memory test patterns and generates a corresponding memory test program for use on an economical memory tester. The authors report a sample time savings of 99% over manual conversion

Published in:

Design & Test of Computers, IEEE  (Volume:14 ,  Issue: 1 )