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Alpha 21164 testability strategy

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2 Author(s)
Bhavsar, D.K. ; Digital Equipment Corp., Hudson, MA, USA ; Edmondson, J.H.

A custom DFT strategy solved specific testability and manufacturing issues for this high performance microprocessor. Hardware and software assisted self test and self repair features helped meet aggressive schedule and manufacturing quality and cost goals

Published in:

Design & Test of Computers, IEEE  (Volume:14 ,  Issue: 1 )