Cart (Loading....) | Create Account
Close category search window
 

Fast semi-global stereo matching via extracting disparity candidates from region boundaries

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Chen, W. ; Coll. of Inf. Syst. & Manage., Nat. Univ. of Defense Technol., Changsha, China ; Zhang, M.-J. ; Xiong, Z.-H.

This study proposes a novel fast stereo matching algorithm via semi-global energy optimisation, which achieves a considerable improvement in efficiency for just a small price in accuracy. Based on some assumptions, the authors discover that at most two disparity candidates for each scanline segment of reference image can be extracted. With this observation, the authors present a disparity candidate extraction algorithm. This algorithm constructs an energy function based on colour consistency and restrictions between region boundaries. In this approach, the energy function is optimised via the graph-cuts technique, and the pixels involved are only those positioned on region boundaries, which results in greatly reduced vertex number in the constructed graph and subsequently improved efficiency. After that, a simple partial occlusions handling is conducted as a post-processing to enhance the accuracy of the final disparity map, by selecting a right disparity for each segment from extracted candidates. The performances of our method are demonstrated by experiments on the Middlebury test set.

Published in:

Computer Vision, IET  (Volume:5 ,  Issue: 2 )

Date of Publication:

March 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.