The ambient stability of thin-film transistors (TFTs) based on zinc oxide (ZnO) nanowires embedded in poly(3,3‴-dialkyl-quarterthiophene) was monitored through time dependence of electrical characteristics over a period of 16 months. The hybrid-based TFT showed an initial hole mobility in the linear regime of 4.2×10-4 cm2/V s. After 16 months storage in ambient conditions (exposed to air, moisture, and light) the mobility decreased to 2.3×10-5 cm2/V s. Comparatively the organic-based TFT lost total carrier mobility after one month storage making the hybrid-based TFTs more suitable for transistor applications when improved stability combined with structural flexibility are required.
Published in:
Applied Physics Letters
(Volume:98
,
Issue:
10
)
Date of Publication:
Mar 2011
- Page(s):
-
102106
-
102106-3
- ISSN :
-
0003-6951
- Digital Object Identifier :
-
10.1063/1.3560982
- Product Type:
-
Journals & Magazines
- Date of Current Version :
-
14 March 2011
- Issue Date :
-
Mar 2011