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A Large \sigma V _{\rm TH} /VDD Tolerant Zigzag 8T SRAM With Area-Efficient Decoupled Differential Sensing and Fast Write-Back Scheme

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10 Author(s)

Nanometer SRAM cannot achieve lower VDDmin due to read-disturb, half-select disturb and write failure. This paper demonstrates quantitative performance advantages of a zigzag 8T-SRAM (Z8T) cell over the decoupled single-ended sensing 8T-SRAM (DS8T) with write-back schemes, which was previously recognized as the most area-efficient cell under large σVTH/VDD conditions. Since Z8T uses only 1T for each decoupled read-port, faster 2T differential sensing (D2S) can be implemented within the same area as the single-ended DS8T. Thanks to D2S, Z8T cell enables much faster R/W speed at VDDmin than DS8T. For the same VDDmin/speed, Z8T reduces the cell area by 15%. The Z8T 32 Kb macro is 14% smaller area and 53% faster than DS8T cells. Three macros were fabricated using foundry provided 65 nm low-power and 90 nm generic processes. The measured VDDmin for a 65 nm 256-row 32 Kb and a 32-row 4 Kb macro are 430 mV and 250 mV respectively. The measured VDDmin for a 90 nm 256-row 64 Kb macro is 230 mV.

Published in:

IEEE Journal of Solid-State Circuits  (Volume:46 ,  Issue: 4 )