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Boundary scan and its application to analog-digital ASIC testing in a board/system environment

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1 Author(s)

The author introduces the concept and motivations for developing boundary scan (BS) and explains the input BS cell, the output BS cell, and the bidirectional BS cell. He then describes the application of boundary scan to the testing of analog-digital application-specific integrated circuits (ASICs) in a board/system environment. An example is given to illustrate the concept and the application

Published in:

Custom Integrated Circuits Conference, 1989., Proceedings of the IEEE 1989

Date of Conference:

15-18 May 1989