By Topic

Array of sensors with A/D conversion based on flip-flops

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Lian, W. ; Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands ; Wouters, S.E.

An array of silicon light intensity sensors is described. Switched bias flip-flops are used to obtain a digital output. The flip-flops contain bipolar transistors which are sensitive to illumination. A triangle-wave voltage is used for analog-to-digital conversion. An analysis of the resolution of the measurement technique when it is used for low-signal level high-resolution measurement is presented. Experimental results for optical flip-flop sensor arrays based on phototransistors, fabricated in the bipolar process, are presented. The devices contain 64 flip-flop sensors organized in 8×8 arrays. Each flip-flop sensor consists of two resistors and two phototransistors, of which one is covered by aluminum

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:39 ,  Issue: 4 )