Close category search window
 

Application of Image Mosaic Algorithm in Lateral Multi-lens Video Logging

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Hu Hong-tao ; Sch. of Comput. Sci., Xi''an ShiYou Univ., Xi''an, China ; Lin Xia ; Li Zhou-li

The wall sequence images acquired by lateral multi-lens video logging method had some peculiarities that the overlap region of adjacent images can be estimated. This paper proposed an image mosaic algorithm which first estimated the overlap areas of adjacent images, and then matched for the areas with SIFT feature matching algorithm. To achieve seamless image stitching, the gradated in-and-out linear fusion algorithm had been adopted to match overlap images. The experiments showed that this method can rapidly and accurately extract the corresponding adjacent image matching points, acquire the panoramic mosaic image of the lateral multi-lens video logging, and lay a foundation for the logging results analysis in the next stage.

Published in:
Measuring Technology and Mechatronics Automation (ICMTMA), 2011 Third International Conference on  (Volume:1 )

Date of Conference: 6-7 Jan. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.