By Topic

Spectral-domain phase microscopy with improved sensitivity using two-dimensional detector arrays

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
5 Author(s)
Singh, K. ; Centre de Recherche, Hôpital Maisonneuve-Rosemont, Montréal, Quebec, Canada ; Dion, C. ; Lesk, M. R. ; Ozaki, T.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

In this work we demonstrate the use of two-dimensional detectors to improve the signal-to-noise ratio (SNR) and sensitivity in spectral-domain phase microscopy for subnanometer accuracy measurements. We show that an increase in SNR can be obtained, from 82 dB to 105 dB, using 150 pixel lines of a low-cost CCD camera as compared to a single line, to compute an averaged axial scan. In optimal mechanical conditions, phase stability as small as 92 μrad, corresponding to 6 pm displacement accuracy, could be obtained. We also experimentally demonstrate the benefit of spatial-averaging in terms of the reduction of signal fading due to an axially moving sample. The applications of the improved system are illustrated by imaging live cells in culture.

Published in:

Review of Scientific Instruments  (Volume:82 ,  Issue: 2 )