Cart (Loading....) | Create Account
Close category search window
 

Local piezoelectric effect on single crystal ZnO microbelt transverse I-V characteristics

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Li, M. ; Corrosion and Protection Center, Key Laboratory for Environmental Fracture (MOE), University of Science and Technology Beijing, Beijing 100083, People’s Republic of China ; Su, Y. J. ; Chu, W. Y. ; Qiao, L. J.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3555456 

One-dimensional ZnO microbelts were prepared by chemical vapor deposition on Si substrates with sputtered Pt film. Using Pt-coated atomic force microscope (AFM) tip, the belts’ transverse I-V characteristics were measured under varying applied elastic loads. ZnO microbelt conductivity reduced with load, but gradually increased upon unloading. Transverse electrical conductivity decrease at higher loads is attributed to the depletion zone formation induced by local piezoelectric effect in ZnO single crystal belt with (0001) top surface indented by the AFM tip. The observed effect can be utilized in a nanoforce sensor device.

Published in:

Applied Physics Letters  (Volume:98 ,  Issue: 8 )

Date of Publication:

Feb 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.