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1 Author(s)
Kirkland, L.V. ; Wes Test Engineering, 810 Shepard Lane, Farmington, UT 84025, USA

We need to focus on the exact cause of failure and perform prognostics during the test and repair cycle. Technology must change for test/diagnosis. With the advent of more robust microcircuits, we need to think “outside-the-box” when it comes to testing. If we continue to perform diagnostics in the same manner, without considering other testing philosophies, we will continue to waste time and resources.

Published in:

Aerospace and Electronic Systems Magazine, IEEE  (Volume:26 ,  Issue: 1 )