Cart (Loading....) | Create Account
Close category search window
 

Development of a rapid-single-flux-quantum shift register for applications in RF noise power metrology

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Kessel, Wolfgang ; Phys. Tech. Bundesanstalt, Braunschweig, Germany ; Buchholz, F.-I. ; Khabipov, M.I. ; Dolata, R.
more authors

Shift registers operated in digital feedback mode and utilized as pseudo random noise generators are very attractive for application as noise standards in rf noise power metrology. The paper reports on the concept of the integrated circuits required, based on superconducting Rapid-Single-Flux-Quantum (RSFQ) logic, and realized in Nb/Al2O3-Al/Nb technology. The design and layout of an 8-bit shift register is presented. Measurement results are reported which prove correct functionality for clock frequencies up to 45 GHz for standard operation. Typical bias current margins for operation of the shift register are ±27%. Further narrow-band limited ranges of operation have been found up to 60 GHz

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:46 ,  Issue: 2 )

Date of Publication:

Apr 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.