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Sine-fit versus discrete Fourier transform-based algorithms in SNR testing of waveform digitizers

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2 Author(s)
Bertocco, M. ; Dipt. di Elettronica e Inf., Padova Univ., Italy ; Narduzzi, C.

The performance of discrete Fourier transform (DFT)-based algorithms employed in signal-to-noise-ratio (SNR) testing of waveform digitizers is analyzed and compared to the performance obtained using sine-fit procedures. Theoretical results are recalled, emphasizing their relevance and importance. Evaluations based on experimental data, obtained by an 8-bit digitizing oscilloscope, show that the accuracies approaches are comparable, while in several respects the methods appear complementary, rather than alternative

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Instrumentation and Measurement, IEEE Transactions on  (Volume:46 ,  Issue: 2 )