Referenced Items are not available for this document.
Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3549628
We report an in situ method of preparing tips for scanning probe microscopy (SPM). Oriented single-crystal nickel oxide (NiO) rods were diced, using a wafer saw, to prepare artificial breaking points. Two geometries, a single rod and a two-sided cut rod were fabricated. The cleavable tips were mounted to a force sensor based on a quartz tuning fork and cleaved using the coarse approach of the SPM. Atomically resolved force microscopy images of NiO (001) were taken with these NiO tips.
Published in:
Review of Scientific Instruments
(Volume:82
,
Issue:
2
)
Date of Publication: Feb 2011
- Page(s):
- 026106 - 026106-3
- ISSN :
- 0034-6748
- Digital Object Identifier :
- 10.1063/1.3549628
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 22 February 2011
- Issue Date :
- Feb 2011
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
