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Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy

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2 Author(s)
Wutscher, T. ; Institute of Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany ; Giessibl, F. J.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3549628 

We report an in situ method of preparing tips for scanning probe microscopy (SPM). Oriented single-crystal nickel oxide (NiO) rods were diced, using a wafer saw, to prepare artificial breaking points. Two geometries, a single rod and a two-sided cut rod were fabricated. The cleavable tips were mounted to a force sensor based on a quartz tuning fork and cleaved using the coarse approach of the SPM. Atomically resolved force microscopy images of NiO (001) were taken with these NiO tips.

Published in:

Review of Scientific Instruments  (Volume:82 ,  Issue: 2 )

Date of Publication:

Feb 2011

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