Cart (Loading....) | Create Account
Close category search window
 

A modular approach for analyzing static and dynamic fault trees

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Gulati, R. ; Alta Group of Cadence Design Syst., Sunnyvale, CA, USA ; Bechta Dugan, J.

Three commonly used analytical techniques for reliability evaluation are fault trees, binary decision diagrams (BDD) and Markov chains. Each of these techniques have advantages and disadvantages and the choice depends on the system being modeled. Fault trees have been found to be the most popular choice in terms of building an analytical model of a system. It provides a compact representation of the system and is easily understood by humans. However, fault trees lack the modeling power and solution time increases exponentially with the size of the system being modeled. In this paper, we present a new exciting hybrid approach, called the modular approach, for the efficient analysis of both static and dynamic fault trees. It provides a combination of BDD solution for static fault trees and Markov chain solution for dynamic fault trees coupled with the detection of independent subtrees. The algorithms used for modularization, integrating the results obtained from the separate solution of the independent modules (subtrees) and incorporating coverage modeling are discussed in detail in this paper. The modular approach is applied to an example system to demonstrate the potential of this research

Published in:

Reliability and Maintainability Symposium. 1997 Proceedings, Annual

Date of Conference:

13-16 Jan 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.