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Thermal-Driven Analog Placement Considering Device Matching

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4 Author(s)
Lin, M.P.-H. ; Dept. of Electr. Eng., Nat. Chung Cheng Univ., Chiayi, Taiwan ; Hongbo Zhang ; Wong, M.D.F. ; Yao-Wen Chang

With the thermal effect, improper analog placements may degrade circuit performance because the thermal impact from power devices can affect electrical characteristics of the thermally-sensitive devices. There is not much previous work that considers the desired placement configuration between power and thermally-sensitive devices for a better thermal profile to reduce the thermally-induced mismatches. This paper first introduces the properties of a desired thermal profile for better thermal matching of the matched devices. It then presents a thermal-driven analog placement methodology to achieve the desired thermal profile and to consider the best device matching under the thermal profile while satisfying the symmetry and the common-centroid constraints. Experimental results based on real analog circuits show that the proposed approach can achieve the best analog circuit performance/accuracy with the least impact due to the thermal gradient, among existing works.

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:30 ,  Issue: 3 )