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Effect of the Resistance of Two Different Coated Conductor on the Current-Limiting Performance of Flux-Lock Type Superconducting Fault Current Limiters

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7 Author(s)
Ho-Ik Du ; Advanced Graduate Education Center of Jeonbuk for Electronics and Information Technology-BK21, Chonbuk National University, Jeonju, S. Korea ; Yong-Jin Kim ; Dong-Hyeok Lee ; Byoung-Sung Han
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The recent increase in power demand has been pressuring industries to continuously extend or expand power sources and transmission and transformer systems. On the other hand, the equivalent impedance of power systems is decreasing. Accordingly, the fault current magnitude in power systems is increasing. Because of such developments, and the rising need to counter this trend, current-limiting technology has been getting much attention as it can efficiently limit the short-circuit faults and improve power system reliability. For this purpose, studies are being carried out on the superconducting fault current limiter (SFCL). In particular, studies on SFCL where normal-conducting devices are combined, instead of the resistor-type SFCL that depends only on the superconductor, are being continued. The development of the element that is suitable for the superconducting fault current limiter combined with the normal-conducting device is also underway. In this study, YBCO thin-film wires that have and do not have a stainless steel stabilizer layer, which is recently studied as the superconducting current-limiting element, were used as superconducting elements of the flux-lock and transformer-shape SFCL consisting of normal-conducting core and coil. The effect of the difference between the resistance values of the two elements on the current-limiting performance of the flux-lock and trans former-shape current limiter was evaluated. For this purpose, the resistance values trend of the two superconducting elements was examined. The initial operational characteristics were compared in terms of quenching time (Iini, IImi, and Tr) and stability (Vmax).

Published in:

IEEE Transactions on Applied Superconductivity  (Volume:21 ,  Issue: 3 )