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Impact of Process Variations on SRAM Single Event Upsets

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5 Author(s)
Kauppila, A.V. ; Electr. Eng. & Comput. Sci. Dept., Vanderbilt Univ., Nashville, TN, USA ; Bhuva, B.L. ; Kauppila, J.S. ; Massengill, L.W.
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Process variations affect the single event (SE) hardness of SRAM cells. Monte-Carlo simulations show this effect and can be used to quantify the significance of process parameter shifts on SRAM SE upset probabilities.

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Nuclear Science, IEEE Transactions on  (Volume:58 ,  Issue: 3 )