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Impact of Process Variations on SRAM Single Event Upsets

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5 Author(s)
A. V. Kauppila ; Electrical Engineering and Computer Science Department, Vanderbilt University, Nashville, TN, USA ; Bharat L. Bhuva ; J. S. Kauppila ; Lloyd W. Massengill
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Process variations affect the single event (SE) hardness of SRAM cells. Monte-Carlo simulations show this effect and can be used to quantify the significance of process parameter shifts on SRAM SE upset probabilities.

Published in:

IEEE Transactions on Nuclear Science  (Volume:58 ,  Issue: 3 )