By Topic

High Thermal Stability of Phosphor-Converted White Light-Emitting Diodes Employing Ce:YAG-Doped Glass

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Wang, J. ; Dept. of Photonics, Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan ; Chun-Chin Tsai ; Wei-Chih Cheng ; Ming-Hung Chen
more authors

High thermal stability of phosphor-converted white light-emitting diodes (PC-WLEDs) using Ce:YAG-doped glass (CeYDG), instead of conventional Ce:YAG-doped silicone (CeYDS), as a PC layer is proposed and fabricated. The proposed CeYDG possesses host stability as glass and retains desired fluorescence as Ce:YAG. The CeYDG employed in the PC-WLED test demonstrates better performances than conventional CeYDS, including lumen loss, chromaticity shift, transmittance loss, and peak emission intensity undergoing three industry-standard reliability tests at either high (8 wt%) or low (2 wt%) doping concentrations of Ce:YAG. While the CeYDG reveals better stability than the CeYDS, we expect even better performance after refining the glass composition and fabrication process for CeYDG due to current processing facility limitations. However, this study clearly demonstrates the feasibility and advantages of adapting glass as a PC layer in PC-WLED modules that can potentially provide higher reliability and better performance for high-end LEDs, particularly in the area where strict reliability is highly required and in the environment where silicone fails to stand for long.

Published in:

Selected Topics in Quantum Electronics, IEEE Journal of  (Volume:17 ,  Issue: 3 )