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Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge

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4 Author(s)

Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.

Published in:

Computer  (Volume:44 ,  Issue: 2 )