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Linearity testing of Analog-to-Digital Converters using imprecise sinusoidal excitations

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3 Author(s)
Vasan, B.K. ; Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA ; Chen, D.J. ; Geiger, R.L.

One of the biggest challenges associated with testing the linearity of high performance Analog-to-Digital Converters (ADCs) is generating a test stimulus more linear or spectrally more pure than the device under test. In this paper we propose algorithms that allow easy to generate, imprecise sinusoidal excitations that differ by a constant voltage to characterize the Integral nonlinearity (INL) of high resolution ADCs. Simulation results indicate that sine waves with SFDR<;40dB can be used to accurately identify the INL of 16-bit ADCs with the proposed methods.

Published in:

Aerospace and Electronics Conference (NAECON), Proceedings of the IEEE 2010 National

Date of Conference:

14-16 July 2010