By Topic

Intercircuit and cross-country fault detection and classification using artificial neural network

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Jain, A. ; Dept. of Electr. Eng., N. I. T. Raipur, Raipur, India ; Thoke, A.S. ; Patel, R.N. ; Koley, E.

The conductor geometry in double circuit lines makes them prone to multi-circuit faults like earthed and unearthed intercircuit faults and cross country faults. The probability of inter-circuit faults is increased when the multiple lines are mounted on the same tower. Mutual coupling is also present during un-earthed intercircuit faults. The phase-to-phase inter-circuit fault (without earth connection) provokes the presence of zero-sequence current, which is detected by ground distance relays. The consequences of intercircuit faults are often not considered in conventional relay design philosophies. In this paper both earthed and un-earthed intercircuit faults are investigated. Artificial neural network based technique has been employed for detection and faulty phase identification (classification) of intercircuit and cross-country faults. The study is carried out on a MATLAB® platform and results of ANN based fault detector/classifier are presented and discussed. The simulated test results shows that this technique detects and identifies the faulted phase correctly and quickly over wide range of power system operating conditions; which is a striking benefit of ANN based technique.

Published in:

India Conference (INDICON), 2010 Annual IEEE

Date of Conference:

17-19 Dec. 2010