Close category search window
 

A new fusion algorithm for shadow penetration using visible and midwave infrared polarimetric images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Lavigne, D.A. ; Defence R&D Canada, Quebec City, QC, Canada ; Breton, M.

This paper presents a new polarimetric image fusion algorithm to discriminate objects lying in shadow areas against cluttered backgrounds. Polarimetric signatures of man-made objects are collected using a fully automated passive polarimetric sensor-suite operating in the visible, shortwave, midwave, and longwave infrared bands. The polarization state of the radiation emitted and/or reflected from objects' surfaces and surrounding background is characterized using the total intensity, the degree of linear polarization, and the phase of the polarization. Using two distinct scenarios, experimental results demonstrate the utility of the proposed image fusion algorithm to exploit the polarized signatures of man-made objects in the visible and midwave infrared bands for shadow penetration purposes.

Published in:
Information Fusion (FUSION), 2010 13th Conference on

Date of Conference: 26-29 July 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.