Cart (Loading....) | Create Account
Close category search window

ECOS: Stable Matching Based Metal-Only ECO Synthesis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Jiang, I.H.-R. ; Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan ; Hua-Yu Chang

To ease the time-to-market pressure and save the photomask cost, metal-only ECO realizes the last-minute design changes by revising the photomasks of metal layers only. This task is challenging because the pre-injected spare cells are limited in number and in cell types. Metal-only ECO has to implement these functional and/or timing changes using available spare cells. In this paper, we propose a stable matching based metal-only ECO synthesizer, named ECOS, that can implement the incremental design changes correctly without sacrificing timing and routability. The experiments are conducted on nine industrial testcases. These testcases reflect the real difficulties faced by designers and our results show that ECOS is promising for all of them.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:20 ,  Issue: 3 )

Date of Publication:

March 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.