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Hybrid integration has been employed for most of the current market available silicon photonics. A novel modular packaging scheme, MEPIC-iMEP3, is proposed for rapid development and high flexibility. One of the critical modules in this packaging scheme is the multichip integration onto the i-MEP3 substrate for sub-micron accuracy. In this study, a series of specially designed test chips and test substrate were fabricated for evaluation using flip-chip bonder. Results show that lateral placement accuracy of <;1μm and rotational accuracy of <;0.05° can be achieved with proper selection of alignment marks. The use of alternating thin Au-Sn layers can precisely control the solder thickness and volume. By optimizing the bonding conditions, a tilting angle of <;0.05° and an average bondline thickness of ~2 μm can be obtained. 3 test chips were bonded onto single substrate successively with a sub-micron accuracy of <;0.5 μm. Shear test is employed to verify the bonding conditions that are properly selected. A simplified MEPIC-iMEP3 test vehicle which requires two bonding for MEPIC and LD was demonstrated with an optical loss of ~-3.0dB due to positional mis-alignment.