Close category search window
 

The KA-MLFMA hybrid algorithm for analyzing the electromagnetic scattering from a 3-D target over random rough surface

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Wei Liu ; Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China ; Zhiqin Zhao ; Wei Yang ; Zaiping Nie

A hybrid algorithm combining the analytic Kirchhoff approximation (KA) and the numerical multilevel fast multipole algorithm (MLFMA) is proposed to calculate the electromagnetic scattering from a composite model of three-dimensional (3-D) perfect electric conducting (PEC) object over Gaussian random rough PEC surfaces. The KA and MLFMA are used to deal with calculations of the Gaussian rough surface and the object, respectively. Meanwhile, an iterative approach is employed to analyze the coupling interactions between the object and rough surfaces. From some numerical results, it can be illustrated that this hybrid algorithm can not only give the reliable results, but also greatly reduce the computational costs comparing with conventional numerical methods. The bi-static difference field radar cross-section (RCS) of a 3-D object above random rough surfaces is also discussed in this paper.

Published in:
Intelligent Signal Processing and Communication Systems (ISPACS), 2010 International Symposium on

Date of Conference: 6-8 Dec. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.